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TECHNICAL PAPERS

Transition of Refrigeration Thermodynamic Analysis From Component to a Radar Power System

[+] Author and Article Information
Mysore Ramalingam

UES, Inc., Dayton, OH 45432-1894e-mail: ramaliml@wl.wpafb.af.mil

Brian Donovan, Jerry E. Beam

Power Division, USAF Research Laboratory, Wright Patterson Air Force Base, OH 45433-7251

J. Energy Resour. Technol 122(3), 153-160 (Jun 10, 2000) (8 pages) doi:10.1115/1.1289766 History: Received September 05, 1999; Revised June 10, 2000
Copyright © 2000 by ASME
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References

Fingers, R. T., and Oberly, C. E., 1991, “Implications of High Temperature Superconductors for Power Generation,” 26th IECEC, Vol. 4, Boston, MA, pp. 564–569.
Oberly,  C. E., 1977, “Air Force Applications of Lightweight Superconducting Machinery,” IEEE Trans. Magn., MAG-13, pp. 260–268.
Ramalingam, M. L., Donovan, B. D., Lamp, T. R., and Beam, J. E., 1996, “Systems Analysis For A Cryogenic Aerospace Terrestrial Radar Power System,” Proc., 31st IECEC, Vol. 1.
Donovan, B. D., Mahefkey, E. T., and Ramalingam, M. L., 1995, “Effects of Refrigeration in a Transportable Cryogenic Aerospace Application,” Proc., 30th IECEC, Vol. 1, pp. 473–478.
Foty,  D. P., 1990, “Impurity Ionization in MOSFETs at Very Low Temperatures,” Cryogenics, 30, pp. 1056–1063.
Mueller,  O., 1990, “Switching Losses of the Cryogenic MOSFET and SIT,” Cryogenics, 30, pp. 1094–1100.
Sze, S. M., 1985, Semiconductor Devices: Physics and Technology, Wiley, New York.
Pires,  R. G., Dickstein,  R. M., Titcomb,  S. L., and Anderson,  R. L., 1990, “Carrier Freeze Out in Silicon,” Cryogenics, 30, pp. 1064–1068.
Kirschmour, R. K., 1986, Low Temperature Electronics, IEEE Press, New York.
Mueller,  O., 1989, “On-Resistance, Thermal Resistance and Reverse Recovery Time of Power MOSFETs at 77K,” Cryogenics, 29, pp. 1006–1014.
Mueller, O., 1991, “Cryogenic Power Conversion—Combining HT Superconductors and Semiconductors,” AIP Conference Proc. 251, Am. Inst. Phys., New York, NY.
Lawless, W. N., 1992, “Cryogenic Ceramic Multilayer Capacitors,” USAF Technical Report, CeramPhysics, Inc., WL-TR-92-2124.
Mathes, K. N., and Minnich, S. H., 1965, “Cryogenic Capacitor Investigation,” General Electric Co., Final Report, S-67-1095.
Schempp, E., and Jackson, W. D., 1996, “System Considerations in Capacitive Energy Storage,” Proc., 31st IECEC, Vol. 2, pp. 666–671.
Moynihan, J. D., 1987, “Selection and Application of Capacitors,” Components Technology Institute, Inc.
Donovan, B. D., Ramalingam, M. L., and Mahefkey, E. T., 1995, “Refrigeration Penalties for Cryocooling Power Semiconductor Devices,” ASME National Heat Transfer Conference, Portland, OR.
Harris, M., Lasker, J., Gebara, E., and Kikel, T., 1998, “Development of Cryogenic Measurement Techniques for Microwave Power Amplifiers,” 33rd IECEC, Colorado Springs, CO.
Ackermann,  R. A., 1993, “Closed Cycle Refrigeration for SC Application,” Superconductor Industry, 3, pp. 15–24.
Barron, R., 1966, Cryogenic Systems, McGraw Hill, New York.
Walker, G., 1983, Cryocoolers. Part 1: Fundamentals, Plenum Press, New York.

Figures

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Breakeven characteristics for a device cooled to 150 K
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Required ESR values for break even as a function of cryocooled temperature
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Normalized masses for the conventional and all-cooled power system configurations
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Figures-of-merit comparisons for various system configurations evaluated
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Radar power system components
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Schematic representation of the conventional and cryocooled power systems
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Schematic of capacitor input filter application
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Uncooled device (a) and refrigerated device (b)
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Effect of temperature on the output of a commercial GaAs MESFET 17
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Temperature ranges for commercial cryocoolers 18
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Break-even characteristics for the Stirling cycle refrigerator

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