Transition of Refrigeration Thermodynamic Analysis From Component to a Radar Power System

[+] Author and Article Information
Mysore Ramalingam

UES, Inc., Dayton, OH 45432-1894e-mail: ramaliml@wl.wpafb.af.mil

Brian Donovan, Jerry E. Beam

Power Division, USAF Research Laboratory, Wright Patterson Air Force Base, OH 45433-7251

J. Energy Resour. Technol 122(3), 153-160 (Jun 10, 2000) (8 pages) doi:10.1115/1.1289766 History: Received September 05, 1999; Revised June 10, 2000
Copyright © 2000 by ASME
Your Session has timed out. Please sign back in to continue.


Fingers, R. T., and Oberly, C. E., 1991, “Implications of High Temperature Superconductors for Power Generation,” 26th IECEC, Vol. 4, Boston, MA, pp. 564–569.
Oberly,  C. E., 1977, “Air Force Applications of Lightweight Superconducting Machinery,” IEEE Trans. Magn., MAG-13, pp. 260–268.
Ramalingam, M. L., Donovan, B. D., Lamp, T. R., and Beam, J. E., 1996, “Systems Analysis For A Cryogenic Aerospace Terrestrial Radar Power System,” Proc., 31st IECEC, Vol. 1.
Donovan, B. D., Mahefkey, E. T., and Ramalingam, M. L., 1995, “Effects of Refrigeration in a Transportable Cryogenic Aerospace Application,” Proc., 30th IECEC, Vol. 1, pp. 473–478.
Foty,  D. P., 1990, “Impurity Ionization in MOSFETs at Very Low Temperatures,” Cryogenics, 30, pp. 1056–1063.
Mueller,  O., 1990, “Switching Losses of the Cryogenic MOSFET and SIT,” Cryogenics, 30, pp. 1094–1100.
Sze, S. M., 1985, Semiconductor Devices: Physics and Technology, Wiley, New York.
Pires,  R. G., Dickstein,  R. M., Titcomb,  S. L., and Anderson,  R. L., 1990, “Carrier Freeze Out in Silicon,” Cryogenics, 30, pp. 1064–1068.
Kirschmour, R. K., 1986, Low Temperature Electronics, IEEE Press, New York.
Mueller,  O., 1989, “On-Resistance, Thermal Resistance and Reverse Recovery Time of Power MOSFETs at 77K,” Cryogenics, 29, pp. 1006–1014.
Mueller, O., 1991, “Cryogenic Power Conversion—Combining HT Superconductors and Semiconductors,” AIP Conference Proc. 251, Am. Inst. Phys., New York, NY.
Lawless, W. N., 1992, “Cryogenic Ceramic Multilayer Capacitors,” USAF Technical Report, CeramPhysics, Inc., WL-TR-92-2124.
Mathes, K. N., and Minnich, S. H., 1965, “Cryogenic Capacitor Investigation,” General Electric Co., Final Report, S-67-1095.
Schempp, E., and Jackson, W. D., 1996, “System Considerations in Capacitive Energy Storage,” Proc., 31st IECEC, Vol. 2, pp. 666–671.
Moynihan, J. D., 1987, “Selection and Application of Capacitors,” Components Technology Institute, Inc.
Donovan, B. D., Ramalingam, M. L., and Mahefkey, E. T., 1995, “Refrigeration Penalties for Cryocooling Power Semiconductor Devices,” ASME National Heat Transfer Conference, Portland, OR.
Harris, M., Lasker, J., Gebara, E., and Kikel, T., 1998, “Development of Cryogenic Measurement Techniques for Microwave Power Amplifiers,” 33rd IECEC, Colorado Springs, CO.
Ackermann,  R. A., 1993, “Closed Cycle Refrigeration for SC Application,” Superconductor Industry, 3, pp. 15–24.
Barron, R., 1966, Cryogenic Systems, McGraw Hill, New York.
Walker, G., 1983, Cryocoolers. Part 1: Fundamentals, Plenum Press, New York.


Grahic Jump Location
Radar power system components
Grahic Jump Location
Schematic representation of the conventional and cryocooled power systems
Grahic Jump Location
Schematic of capacitor input filter application
Grahic Jump Location
Uncooled device (a) and refrigerated device (b)
Grahic Jump Location
Effect of temperature on the output of a commercial GaAs MESFET 17
Grahic Jump Location
Temperature ranges for commercial cryocoolers 18
Grahic Jump Location
Break-even characteristics for the Stirling cycle refrigerator
Grahic Jump Location
Breakeven characteristics for a device cooled to 150 K
Grahic Jump Location
Required ESR values for break even as a function of cryocooled temperature
Grahic Jump Location
Normalized masses for the conventional and all-cooled power system configurations
Grahic Jump Location
Figures-of-merit comparisons for various system configurations evaluated



Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related Journal Articles
Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In