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Issues
March 2022
ISSN 1043-7398
EISSN 1528-9044
In this Issue
Editorial
Reviewer's Recognition
J. Electron. Packag. March 2022, 144(1): 010201.
doi: https://doi.org/10.1115/1.4053637
Review Articles
A Review on Transient Thermal Management of Electronic Devices
J. Electron. Packag. March 2022, 144(1): 010801.
doi: https://doi.org/10.1115/1.4050002
Topics:
Cooling
,
Heat
,
Heat pipes
,
Phase change materials
,
Temperature
,
Thermal management
,
Transients (Dynamics)
,
Vapors
,
Boiling
,
Steady state
Spray Cooling on Enhanced Surfaces: A Review of the Progress and Mechanisms
J. Electron. Packag. March 2022, 144(1): 010802.
doi: https://doi.org/10.1115/1.4050046
Topics:
Cooling
,
Heat transfer
,
Sprays
,
Critical heat flux
,
Drops
Underfill Flow in Flip-Chip Encapsulation Process: A Review
J. Electron. Packag. March 2022, 144(1): 010803.
doi: https://doi.org/10.1115/1.4050697
Topics:
Flow (Dynamics)
,
Flip-chip
,
Fluids
,
Optimization
,
Design
,
Reliability
Research Papers
Micro Solder Joint Reliability and Warpage Investigations of Extremely Thin Double-Layered Stacked-Chip Packaging
J. Electron. Packag. March 2022, 144(1): 011001.
doi: https://doi.org/10.1115/1.4050198
Topics:
Creep
,
Fatigue
,
Packaging
,
Reliability
,
Solder joints
,
Warping
,
Finite element analysis
,
Stress
,
Solders
,
Silicon
Microstructure and Properties of Nb Nanoparticles Reinforced Sn–0.7Cu Solder Alloy
J. Electron. Packag. March 2022, 144(1): 011002.
doi: https://doi.org/10.1115/1.4051025
Topics:
Alloys
,
Composite materials
,
Nanoparticles
,
Solders
,
Tin
,
Tensile strength
Stochastic Finite Element Thermal Analysis of a Ball Grid Array Package
J. Electron. Packag. March 2022, 144(1): 011003.
doi: https://doi.org/10.1115/1.4050696
Topics:
Ball-Grid-Array packages
,
Design
,
Failure
,
Finite element analysis
,
Finite element methods
,
Heat
,
Probability
,
Reliability
,
Temperature
,
Thermal analysis
Electric-Drive Vehicle Power Electronics Thermal Management: Current Status, Challenges, and Future Directions
J. Electron. Packag. March 2022, 144(1): 011004.
doi: https://doi.org/10.1115/1.4049815
Topics:
Cooling
,
Electronics
,
Fluids
,
Heat exchangers
,
Heat transfer
,
Thermal management
,
Thermal resistance
,
Vehicles
,
Heat
,
Temperature
Reliability Analysis of Solder Joints on Rigid-Flexible Printed Circuit Board for MEMS Pressure Sensors Under Combined Temperature Cycle and Vibration Loads With Continuously Monitored Electrical Signals
J. Electron. Packag. March 2022, 144(1): 011005.
doi: https://doi.org/10.1115/1.4049813
Topics:
Cycles
,
Microelectromechanical systems
,
Modeling
,
Pressure sensors
,
Signals
,
Stress
,
Temperature
,
Vibration
,
Solder joints
,
Soldering
Validation of the Critical Strain-Based Methodology for Evaluating the Mechanical Safety of Ball Grid Array Solder Joints in a Launch Random Vibration Environment
J. Electron. Packag. March 2022, 144(1): 011006.
doi: https://doi.org/10.1115/1.4050512
Topics:
Fatigue life
,
Random vibration
,
Safety
,
Solder joints
,
Ball-Grid-Array packaging
Fatigue Testing of Copper Nanoparticle-Based Joints and Bonds
Rajesh Sharma Sivasubramony, Maan Zaid Kokash, Sanoop Thekkut, Ninad Shahane, Patrick Thompson, Kabir Mirpuri, Yuki Kawana, Christopher M. Greene, Peter Borgesen
J. Electron. Packag. March 2022, 144(1): 011007.
doi: https://doi.org/10.1115/1.4050871
Topics:
Annealing
,
Cycles
,
Damage
,
Deformation
,
Dislocations
,
Fatigue
,
Fatigue life
,
Nanoparticles
,
Particulate matter
,
Shear strength
Sensitivity Coefficient-Based Inverse Heat Conduction Method for Identifying Hot Spots in Electronics Packages: A Comparison of Grid-Refinement Methods
J. Electron. Packag. March 2022, 144(1): 011008.
doi: https://doi.org/10.1115/1.4050200
Topics:
Electronic packages
,
Heat
,
Temperature
,
Errors
,
Heat conduction
Correlation Studies Between Laser Ultrasonic Inspection Data and Finite-Element Modeling Results in Evaluation of Solder Joint Quality in Microelectronic Packages
J. Electron. Packag. March 2022, 144(1): 011009.
doi: https://doi.org/10.1115/1.4050898
Topics:
Cycles
,
Damage
,
Finite element analysis
,
Inspection
,
Lasers
,
Modeling
,
Natural language interfaces
,
Solders
,
Accelerated life testing
,
Density
Improving Ambient Contrast Ratio and Color Uniformity of Mini Full Color Light-Emitting Diodes Using an SiO2/Graphite Bilayered Packaging Structure
J. Electron. Packag. March 2022, 144(1): 011010.
doi: https://doi.org/10.1115/1.4050202
Numerical Modeling of the Wave Soldering Process and Experimental Validation
Violeta Carvalho, Bruno Arcipreste, Delfim Soares, Luís Ribas, Nelson Rodrigues, Senhorinha F. C. F. Teixeira, José Carlos Teixeira
J. Electron. Packag. March 2022, 144(1): 011011.
doi: https://doi.org/10.1115/1.4050981
Topics:
Computer simulation
,
Soldering
,
Solders
,
Wave soldering
,
Waves
,
Strain measurement
,
Fluids
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