This paper is concerned with the analysis of thin and ultra-thin liquid films. The results are applicable to various geometrical and kinematic conditions, including both stationary and moving surfaces. The new results obtained in this work include: • the derivation of an analytical solution for the evolution of film thickness over the entire multiscale range, from the liquid free surface to the asymptotic (disjoining-pressure controlled) region, and for any surface inclination angle between 0 deg and 90 deg, • the formulation of a method to deduce the Hamaker constant based on a single measured value of film thickness at the beginning of the disjoining-pressure-controlled region, applicable to any inclination angle, • the explanation of the reasons why the thickness of liquid films on moving surfaces is normally beyond the range of Van der Waals forces, • the formulation of an expression for the nondimensional asymptotic film thickness as a function of the capillary number; this new result explicitly accounts for the effect of gravity on the average film velocity.
The Modeling of Thin Liquid Films Along Inclined Surfaces
Contributed by the Fluids Engineering Division for publication in the JOURNAL OF FLUIDS ENGINEERING. Manuscript received by the Fluids Engineering Division May 27, 2003; revised October 17, 2003. Associate Editor: S. Balachandar.
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Podowski, M. Z., and Kumbaro, A. (September 10, 2004). "The Modeling of Thin Liquid Films Along Inclined Surfaces ." ASME. J. Fluids Eng. July 2004; 126(4): 565–572. https://doi.org/10.1115/1.1777228
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