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I. C. Noyan
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Journal Articles

Measurement of Interface Thermal Resistance With Neutron Diffraction

Seung-Yub Lee, Harley Skorpenske, Alexandru D. Stoica, Ke An, Xun-Li Wang, I. C. Noyan
Journal: ASME Journal of Heat and Mass Transfer
Publisher: ASME
Article Type: Research-Article
J. Heat Mass Transfer. March 2014, 136(3): 031302.
Paper No: HT-12-1504
https://doi.org/10.1115/1.4025500
Published Online: November 28, 2013
View Article titled, Measurement of Interface Thermal Resistance With Neutron Diffraction
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Topics: Neutron diffraction, Temperature, Thermal resistance, Heat, Thermocouples, Thermal conductivity
Journal Articles

Microscale Laser Shock Peening of Thin Films, Part 1: Experiment, Modeling and Simulation

Wenwu Zhang, Y. Lawrence Yao, I. C. Noyan
Journal: Journal of Manufacturing Science and Engineering
Publisher: ASME
Article Type: Technical Papers
J. Manuf. Sci. Eng. February 2004, 126(1): 10–17.
https://doi.org/10.1115/1.1645878
Published Online: March 18, 2004
View Article titled, Microscale Laser Shock Peening of Thin Films, Part 1: Experiment, Modeling and Simulation
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Topics: Copper, Laser hardening, Lasers, Microscale devices, Modeling, Pressure, Shock (Mechanics), Silicon, Simulation, Stress
Journal Articles

Microscale Laser Shock Peening of Thin Films, Part 2: High Spatial Resolution Material Characterization

Wenwu Zhang, Y. Lawrence Yao, I. C. Noyan
Journal: Journal of Manufacturing Science and Engineering
Publisher: ASME
Article Type: Technical Papers
J. Manuf. Sci. Eng. February 2004, 126(1): 18–24.
https://doi.org/10.1115/1.1645879
Published Online: March 18, 2004
View Article titled, Microscale Laser Shock Peening of Thin Films, Part 2: High Spatial Resolution Material Characterization
Open the PDF for Microscale Laser Shock Peening of Thin Films, Part 2: High Spatial Resolution Material Characterization in another window
Topics: Copper, Laser hardening, Microscale devices, Nanoindentation, Resolution (Optics), Shock (Mechanics), Stress, Thin films, X-ray diffraction, X-rays